Search results for: Cadmus Yuan
Microelectronics Reliability > 2014 > 54 > 11 > 2448-2455
Applied Thermal Engineering > 2014 > 63 > 2 > 588-597
Journal of Molecular Modeling > 2012 > 18 > 6 > 2333-2341
Microelectronics Reliability > 2014 > 54 > 11 > 2448-2455
Applied Thermal Engineering > 2014 > 63 > 2 > 588-597
Journal of Molecular Modeling > 2012 > 18 > 6 > 2333-2341