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IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 3991 - 3997
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 422 - 431
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2099 - 2105
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2092 - 2098
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 5 > 1774 - 1781
2017 IEEE International Reliability Physics Symposium (IRPS) > 6A-3.1 - 6A-3.8
2017 IEEE International Reliability Physics Symposium (IRPS) > 3E-3.1 - 3E-3.6
2017 IEEE International Reliability Physics Symposium (IRPS) > 5C-5.1 - 5C-5.7
IEEE Electron Device Letters > 2017 > 38 > 3 > 345 - 348
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 945 - 952
IEEE Transactions on Nanotechnology > 2017 > 16 > 2 > 209 - 216
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 541 - 548