Search results for: Cher Xuan Zhang
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 233 - 238
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 541 - 548
IEEE Transactions on Nuclear Science > 2015 > 62 > 6-1 > 2412 - 2416
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 352 - 358
Microelectronics Reliability > 2014 > 54 > 11 > 2355-2359
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 2834 - 2838
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 2959 - 2964
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 2868 - 2873
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 3210 - 3217
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 2862 - 2867
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 3226 - 3235
IEEE Transactions on Nuclear Science > 2013 > 60 > 6-1 > 4080 - 4086
IEEE Transactions on Electron Devices > 2013 > 60 > 7 > 2361 - 2367
IEEE Electron Device Letters > 2013 > 34 > 1 > 117 - 119
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 391 - 398
IEEE Transactions on Nuclear Science > 2012 > 59 > 6-1 > 2974 - 2978
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-2 > 764 - 769
IEEE Transactions on Nuclear Science > 2011 > 58 > 6-1 > 2925 - 2929