Wyniki wyszukiwania
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 142 - 149
IEEE Transactions on Electron Devices > 2016 > 63 > 3 > 946 - 953
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 567 - 575
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 384 - 393
IEEE Transactions on Electron Devices > 2015 > 62 > 7 > 2219 - 2225
IEEE Transactions on Electron Devices > 2015 > 62 > 6 > 1811 - 1818
IEEE Transactions on Electron Devices > 2015 > 62 > 3 > 757 - 763
IEEE Transactions on Electron Devices > 2015 > 62 > 3 > 743 - 750
IEEE Transactions on Electron Devices > 2014 > 61 > 5 > 1436 - 1443
IEEE Transactions on Electron Devices > 2014 > 61 > 2 > 351 - 358
2013 IEEE International Reliability Physics Symposium (IRPS) > 2A.4.1 - 2A.4.4
2013 IEEE International Reliability Physics Symposium (IRPS) > XT.4.1 - XT.4.9