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IEEE Transactions on Electron Devices > 2014 > 61 > 9 > 3081 - 3089
IEEE Electron Device Letters > 2011 > 32 > 1 > 81 - 83
IEEE Transactions on Electron Devices > 2011 > 58 > 4 > 1189 - 1196
2010 IEEE International Reliability Physics Symposium > 1117 - 1121