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IEEE Electron Device Letters > 2018 > 39 > 1 > 4 - 7
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4393 - 4399
2017 IEEE International Reliability Physics Symposium (IRPS) > 2A-1.1 - 2A-1.7
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 4 > 1444 - 1454
IEEE Transactions on Electron Devices > 2016 > 63 > 11 > 4346 - 4351
IEEE Transactions on Electron Devices > 2016 > 63 > 3 > 910 - 915
2015 IEEE International Electron Devices Meeting (IEDM) > 20.3.1 - 20.3.4
2015 IEEE International Reliability Physics Symposium > XT.4.1 - XT.4.4
2015 IEEE International Reliability Physics Symposium > XT.7.1 - XT.7.6