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2013 IEEE International Electron Devices Meeting > 26.5.1 - 26.5.4
TENCON 2011 - 2011 IEEE Region 10 Conference > 797 - 801
2011 International Reliability Physics Symposium > CD.1.1 - CD.1.6
IEEE Electron Device Letters > 2010 > 31 > 10 > 1104 - 1106