Search results for: Xiaoyan Liu
2017 IEEE International Reliability Physics Symposium (IRPS) > 3E-3.1 - 3E-3.6
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 1053 - 1059
IEEE Journal of the Electron Devices Society > 2016 > 4 > 5 > 246 - 252
2016 IEEE Silicon Nanoelectronics Workshop (SNW) > 196 - 197
2016 IEEE International Reliability Physics Symposium (IRPS) > 2A-3-1 - 2A-3-7
IEEE Electron Device Letters > 2015 > 36 > 10 > 1091 - 1093
IEEE Transactions on Electron Devices > 2015 > 62 > 10 > 3229 - 3236
2015 IEEE International Reliability Physics Symposium > XT.6.1 - XT.6.4