Search results for: Kary Chien
Microelectronics Reliability > 2016 > 64 > C > 185-188
Microelectronics Reliability > 2016 > 64 > C > 220-224
IEEE Transactions on Reliability > 2015 > 64 > 4 > 1158 - 1163
2015 IEEE International Reliability Physics Symposium > BD.2.1 - BD.2.5