Search results for: C. Gaquiere
Current Applied Physics > 2017 > 17 > 12 > 1601-1608
IEEE Transactions on Nuclear Science > 2017 > 64 > 8-1 > 2284 - 2291
Solid-State Electronics > 2017 > 127 > C > 13-19
2015 IEEE International Electron Devices Meeting (IEDM) > 15.7.1 - 15.7.4
Microelectronics Reliability > 2015 > 55 > 9-10 > 1719-1723
Opto-Electronics Review > 2015 > Vol. 23, No. 3 > 195-199
Electronics Letters > 2014 > 50 > 15 > 1070 - 1072
CAS 2013 (International Semiconductor Conference) > 2 > 181 - 184