Search results for: Yong Kang
IEEE Electron Device Letters > 2013 > 34 > 9 > 1133 - 1135
IEEE Electron Device Letters > 2012 > 33 > 11 > 1517 - 1519
2011 International Reliability Physics Symposium > XT.1.1 - XT.1.5
IEEE Electron Device Letters > 2011 > 32 > 4 > 434 - 436
IEEE Electron Device Letters > 2011 > 32 > 5 > 686 - 688
IEEE Electron Device Letters > 2009 > 30 > 12 > 1365 - 1367
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 171 - 179
IEEE Electron Device Letters > 2009 > 30 > 5 > 523 - 525
IEEE Electron Device Letters > 2009 > 30 > 7 > 760 - 762
IEEE Electron Device Letters > 2009 > 30 > 3 > 298 - 301
IEEE Electron Device Letters > 2006 > 27 > 8 > 640 - 643