Search results for: Se Jong Rhee
IEEE Electron Device Letters > 2006 > 27 > 8 > 640 - 643
Microelectronics Reliability > 2005 > 45 > 7-8 > 1051-1060
IEEE Electron Device Letters > 2006 > 27 > 8 > 640 - 643
Microelectronics Reliability > 2005 > 45 > 7-8 > 1051-1060