Search results for: Kyong Taek Lee
IEEE Transactions on Electron Devices > 2015 > 62 > 4 > 1092 - 1097
2014 IEEE International Electron Devices Meeting > 34.6.1 - 34.6.4
2014 IEEE International Reliability Physics Symposium > XT.17.1 - XT.17.5
Microelectronic Engineering > 2013 > 112 > Complete > 80-83
2013 IEEE International Reliability Physics Symposium (IRPS) > 2D.1.1 - 2D.1.4
2012 IEEE International Reliability Physics Symposium (IRPS) > GD.2.1 - GD.2.4
Microelectronic Engineering > 2011 > 88 > 12 > 3411-3414
2011 International Reliability Physics Symposium > 2A.3.1 - 2A.3.5
IEEE Electron Device Letters > 2011 > 32 > 10 > 1319 - 1321
IEEE Electron Device Letters > 2010 > 31 > 10 > 1104 - 1106
Microelectronic Engineering > 2009 > 86 > 3 > 259-262
IEEE Electron Device Letters > 2009 > 30 > 5 > 523 - 525
IEEE Electron Device Letters > 2009 > 30 > 7 > 760 - 762
IEEE Electron Device Letters > 2008 > 29 > 4 > 389 - 391