Search results for: Hyun Chul Sagong
2017 IEEE International Reliability Physics Symposium (IRPS) > XT-2.1 - XT-2.4
2015 IEEE International Electron Devices Meeting (IEDM) > 11.3.1 - 11.3.4
2015 IEEE International Reliability Physics Symposium > 2F.3.1 - 2F.3.5
IEEE Electron Device Letters > 2013 > 34 > 7 > 828 - 830
IEEE Transactions on Electron Devices > 2013 > 60 > 4 > 1302 - 1309
IEEE Electron Device Letters > 2012 > 33 > 9 > 1234 - 1236
Microelectronic Engineering > 2011 > 88 > 12 > 3411-3414
2011 International Reliability Physics Symposium > 5A.4.1 - 5A.4.5
2011 International Reliability Physics Symposium > XT.1.1 - XT.1.5
IEEE Electron Device Letters > 2011 > 32 > 4 > 434 - 436
IEEE Electron Device Letters > 2011 > 32 > 11 > 1474 - 1476
IEEE Electron Device Letters > 2011 > 32 > 10 > 1319 - 1321
IEEE Electron Device Letters > 2011 > 32 > 12 > 1668 - 1670
IEEE Electron Device Letters > 2010 > 31 > 10 > 1104 - 1106