Search results for: Tomasz Torzewicz
Microelectronics Reliability > 2017 > 79 > C > 405-409
Microelectronics Reliability > 2016 > 67 > C > 15-20
Microelectronics Journal > 2013 > 44 > 11 > 1019-1024
IEEE Transactions on Electron Devices > 2013 > 60 > 2 > 630 - 638