Search results for: Bart Vandevelde
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2017 > 7 > 12 > 1957 - 1964
Microelectronics Reliability > 2017 > 74 > C > 131-135
Microelectronics Reliability > 2014 > 54 > 6-7 > 1200-1205
Microelectronics Reliability > 2012 > 52 > 11 > 2677-2684
Microelectronics Reliability > 2011 > 51 > 6 > 1069-1076