Search results for: K. Ishida
IEEE Electron Device Letters > 2016 > 37 > 12 > 1582 - 1585
2016 IEEE International Reliability Physics Symposium (IRPS) > 5C-1-1 - 5C-1-5
IEEE Transactions on Applied Superconductivity > 2016 > 26 > 3 > 1 - 4
IEEE Electron Device Letters > 2016 > 37 > 12 > 1582 - 1585
2016 IEEE International Reliability Physics Symposium (IRPS) > 5C-1-1 - 5C-1-5
IEEE Transactions on Applied Superconductivity > 2016 > 26 > 3 > 1 - 4