Search results for: Wei Wu
2015 IEEE International Electron Devices Meeting (IEDM) > 32.2.1 - 32.2.4
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2012 > 20 > 11 > 2147 - 2151
2011 International Reliability Physics Symposium > 4C.2.1 - 4C.2.5
IEEE Transactions on Electron Devices > 2011 > 58 > 5 > 1336 - 1343
IEEE Transactions on Nanotechnology > 2011 > 10 > 4 > 875 - 880
IEEE Electron Device Letters > 2009 > 30 > 1 > 39 - 41