Search results for: C. Boit
Microelectronics Reliability > 2017 > 76-77 > C > 233-237
Microelectronics Reliability > 2017 > 76-77 > C > 184-187
Microelectronics Reliability > 2014 > 54 > 9-10 > 2105-2108
Microelectronics Reliability > 2014 > 54 > 9-10 > 1794-1797
Energy Procedia > 2014 > 60 > Complete > 76-80
2013 IEEE International Reliability Physics Symposium (IRPS) > CD.3.1 - CD.3.7
2013 IEEE International Reliability Physics Symposium (IRPS) > 5B.6.1 - 5B.6.7
Microelectronics Reliability > 2012 > 52 > 9-10 > 2024-2030
Microelectronics Reliability > 2012 > 52 > 9-10 > 2031-2034
Microelectronics Reliability > 2011 > 51 > 9-11 > 1632-1636
2011 International Reliability Physics Symposium > 5C.5.1 - 5C.5.6
Microelectronics Reliability > 2011 > 51 > 2 > 217-223
Journal of Failure Analysis and Prevention > 2011 > 11 > 6 > 578-587
Journal of Contemporary Physics (Armenian Academy of Sciences) > 2011 > 46 > 5 > 218-225
Journal of Materials Science: Materials in Electronics > 2011 > 22 > 10 > 1553-1579