Search results for: P. Ivo
2013 IEEE International Reliability Physics Symposium (IRPS) > 3C.1.1 - 3C.1.7
2013 IEEE International Reliability Physics Symposium (IRPS) > CD.3.1 - CD.3.7
Microelectronics Reliability > 2012 > 52 > 9-10 > 2426-2430
Microelectronics Reliability > 2011 > 51 > 9-11 > 1710-1716
Microelectronics Reliability > 2011 > 51 > 2 > 217-223