Search results for: Amitabh Chatterjee
IEEE Sensors Journal > 2017 > 17 > 24 > 8350 - 8355
Microelectronics Reliability > 2017 > 79 > C > 239-247
Optics Communications > 2017 > 394 > C > 69-79
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2106 - 2112
2017 IEEE International Reliability Physics Symposium (IRPS) > PA-3.1 - PA-3.5
IEEE Transactions on Electron Devices > 2016 > 63 > 8 > 3185 - 3192
Solid State Electronics > 2000 > 44 > 9 > 1679-1684