Search results for: Kuan-I Ho
Advanced Materials > 27 > 41 > 6519 - 6525
IEEE Sensors Journal > 2013 > 13 > 6 > 2459 - 2465
Microelectronics Reliability > 2010 > 50 > 5 > 742-746
2009 IEEE Sensors > 1128 - 1131
Advanced Materials > 27 > 41 > 6519 - 6525
IEEE Sensors Journal > 2013 > 13 > 6 > 2459 - 2465
Microelectronics Reliability > 2010 > 50 > 5 > 742-746
2009 IEEE Sensors > 1128 - 1131