Search results for: Wen-Ben Jone
Integration, the VLSI Journal > 2018 > 60 > C > 1-12
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 3 > 1169 - 1173
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 9 > 1628 - 1639
Journal of Electronic Testing > 2013 > 29 > 1 > 49-72
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2011 > 30 > 3 > 455 - 463
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2011 > 19 > 1 > 104 - 117
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2011 > 19 > 7 > 1319 - 1323
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2010 > 29 > 2 > 299 - 312
Journal of Electronic Testing > 2010 > 26 > 3 > 367-392