Search results for: Laung-Terng Wang
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 3 > 942 - 953
Journal of Electronic Testing > 2016 > 32 > 5 > 625-638
Journal of Electronic Testing > 2013 > 29 > 1 > 49-72
2011 IEEE International SOC Conference > 256 - 257
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2011 > 30 > 3 > 455 - 463
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2010 > 29 > 2 > 299 - 312
Journal of Electronic Testing > 2010 > 26 > 3 > 367-392