Search results for: D. Tremouilles
Diamond and Related Materials > 2018 > 88 > C > 163-166
Microelectronics Reliability > 2017 > 76-77 > C > 500-506
Microelectronics Reliability > 2015 > 55 > 9-10 > 1476-1480
Microelectronics Reliability > 2015 > 55 > 9-10 > 1542-1548
Microelectronics Reliability > 2014 > 54 > 9-10 > 2217-2221
Microelectronics Reliability > 2013 > 53 > 2 > 221-228
EOS/ESD Symposium Proceedings > 1 - 9
EOS/ESD Symposium Proceedings > 1 - 8
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 130 - 141
Microelectronics Reliability > 2009 > 49 > 12 > 1440-1446
Microelectronics Reliability > 2009 > 49 > 9-11 > 1103-1106
Microelectronics Reliability > 2009 > 49 > 9-11 > 1256-1259
2009 European Microwave Conference (EuMC) > 1756 - 1759
2009 31st EOS/ESD Symposium > 1 - 8