Search results for: N. Nolhier
Microelectronics Reliability > 2017 > 76-77 > C > 685-691
Microelectronics Reliability > 2016 > 64 > C > 88-92
Microelectronics Reliability > 2015 > 55 > 11 > 2276-2283
Microelectronics Reliability > 2014 > 54 > 9-10 > 2272-2277
Microelectronics Reliability > 2013 > 53 > 9-11 > 1278-1283
Microelectronics Reliability > 2013 > 53 > 2 > 221-228
EOS/ESD Symposium Proceedings > 1 - 9
Microelectronics Reliability > 2009 > 49 > 9-11 > 1256-1259
2009 European Microwave Conference (EuMC) > 1756 - 1759
2009 31st EOS/ESD Symposium > 1 - 8
2009 31st EOS/ESD Symposium > 1 - 6
Microelectronics Reliability > 2008 > 48 > 8-9 > 1237-1240