Wyniki wyszukiwania dla: F. Caignet
Microelectronics Reliability > 2017 > 76-77 > C > 685-691
Microelectronics Reliability > 2016 > 64 > C > 88-92
Microelectronics Reliability > 2015 > 55 > 11 > 2276-2283
Microelectronics Reliability > 2014 > 54 > 9-10 > 2272-2277
Microelectronics Reliability > 2013 > 53 > 9-11 > 1278-1283
Microelectronics Reliability > 2013 > 53 > 2 > 221-228
EOS/ESD Symposium Proceedings > 1 - 9
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2000 > 8 > 5 > 606 - 609