Search results for: E. Bouyssou
Microelectronics Reliability > 2009 > 49 > 9-11 > 1074-1078
Microelectronics Reliability > 2009 > 49 > 9-11 > 1103-1106
Microelectronics Reliability > 2008 > 48 > 8-9 > 1412-1416
Materials Science & Engineering B > 2005 > 118 > 1-3 > 28-33