Search results for: J. Mitard
2013 IEEE International Electron Devices Meeting > 20.4.1 - 20.4.4
2013 IEEE International Electron Devices Meeting > 15.2.1 - 15.2.4
Microelectronic Engineering > 2013 > 109 > Complete > 43-45
Microelectronic Engineering > 2013 > 109 > Complete > 250-256
Solid State Electronics > 2013 > 85 > Complete > 12-14
Solid State Electronics > 2013 > 84 > Complete > 22-27
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 4 > 444 - 455
2012 International Electron Devices Meeting > 30.2.1 - 30.2.4
2012 International Electron Devices Meeting > 6.5.1 - 6.5.4
2012 International Electron Devices Meeting > 28.7.1 - 28.7.4
Materials Science in Semiconductor Processing > 2012 > 15 > 6 > 588-600