Search results for: B. Benbakhti
2017 IEEE International Reliability Physics Symposium (IRPS) > XT-5.1 - XT-5.7
2016 IEEE International Electron Devices Meeting (IEDM) > 21.4.1 - 21.4.4
2014 IEEE International Electron Devices Meeting > 34.2.1 - 34.2.4
Microelectronic Engineering > 2013 > 109 > Complete > 43-45
IEEE Electron Device Letters > 2012 > 33 > 12 > 1681 - 1683
Microelectronic Engineering > 2011 > 88 > 4 > 362-365
Microelectronics Reliability > 2010 > 50 > 3 > 360-364
Microelectronic Engineering > 2009 > 86 > 7-9 > 1564-1567
Materials Science in Semiconductor Processing > 2009 > 12 > 1-2 > 16-20
IEEE Transactions on Electron Devices > 2009 > 56 > 10 > 2178 - 2185
Microelectronics Journal > 2007 > 38 > 1 > 7-13