Search results for: C Argyrides
Microelectronics Reliability > 2012 > 52 > 7 > 1528-1530
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-2 > 981 - 986
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2011 > 19 > 3 > 420 - 428