Search results for: S. Bychikhin
Diamond & Related Materials > 2013 > 40 > Complete > 69-74
Microelectronics Journal > 2012 > 43 > 9 > 618-623
Microelectronics Reliability > 2012 > 52 > 9-10 > 2194-2199
Microelectronics Reliability > 2011 > 51 > 9-11 > 1592-1596
IEEE Transactions on Electron Devices > 2011 > 58 > 2 > 411 - 418
EOS/ESD Symposium Proceedings > 1 - 8
EOS/ESD Symposium Proceedings > 1 - 10
Microelectronics Reliability > 2010 > 50 > 9-11 > 1427-1430
Microelectronics Reliability > 2009 > 49 > 9-11 > 1346-1351
2009 31st EOS/ESD Symposium > 1 - 6