Search results for: D. Pogany
Microelectronics Reliability > 2017 > 76-77 > C > 698-702
Solid-State Electronics > 2016 > 125 > C > 118-124
Microelectronics Reliability > 2016 > 58 > C > 177-184
2015 IEEE International Electron Devices Meeting (IEDM) > 35.5.1 - 35.5.4
2015 IEEE International Reliability Physics Symposium > 6C.2.1 - 6C.2.7
2014 IEEE International Reliability Physics Symposium > 6C.3.1 - 6C.3.6
Diamond & Related Materials > 2013 > 40 > Complete > 69-74
Solid State Electronics > 2013 > 89 > Complete > 207-211
Microelectronics Journal > 2012 > 43 > 9 > 618-623
Microelectronics Reliability > 2012 > 52 > 9-10 > 2194-2199
Thin Solid Films > 2012 > 520 > 19 > 6230-6232
Solid State Electronics > 2012 > 67 > 1 > 74-78
Microelectronics Reliability > 2011 > 51 > 9-11 > 1592-1596
IEEE Transactions on Electron Devices > 2011 > 58 > 2 > 411 - 418
EOS/ESD Symposium Proceedings > 1 - 8
EOS/ESD Symposium Proceedings > 1 - 10