Search results for: A. Touboul
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-2 > 945 - 951
Microelectronics Reliability > 2008 > 48 > 8-9 > 1202-1207
IEEE Transactions on Nuclear Science > 2008 > 55 > 4-1 > 2106 - 2112
Microelectronics Reliability > 2007 > 47 > 9-11 > 1639-1642
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 4 > 617 - 624
Microelectronics Reliability > 2006 > 46 > 9-11 > 1563-1568
Microelectronics Reliability > 2006 > 46 > 9-11 > 1725-1730
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 221 - 227
Microelectronics Reliability > 2005 > 45 > 9-11 > 1415-1420
Microelectronics Reliability > 2005 > 45 > 9-11 > 1611-1616
Solid State Electronics > 2005 > 49 > 6 > 956-964