Search results for: C. Maneux
Microelectronics Reliability > 2017 > 73 > C > 146-152
Microelectronics Reliability > 2015 > 55 > 9-10 > 1433-1437
CAS 2013 (International Semiconductor Conference) > 2 > 311 - 314
IEEE Transactions on Electron Devices > 2012 > 59 > 2 > 516 - 519
Microelectronics Reliability > 2011 > 51 > 9-11 > 1730-1735