Search results for: F. Essely
IEEE Transactions on Nuclear Science > 2009 > 56 > 4-2 > 2014 - 2020
Microelectronics Reliability > 2008 > 48 > 8-9 > 1333-1338
IEEE Transactions on Nuclear Science > 2008 > 55 > 6-1 > 3352 - 3359
IEEE Transactions on Nuclear Science > 2008 > 55 > 6-1 > 2842 - 2853
Microelectronics Reliability > 2007 > 47 > 9-11 > 1599-1603
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 4 > 617 - 624
Microelectronics Reliability > 2006 > 46 > 9-11 > 1563-1568
Microelectronics Reliability > 2005 > 45 > 9-11 > 1415-1420