Search results for: Yuan Wang
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3569 - 3575
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 3 > 577 - 584
2016 IEEE International Electron Devices Meeting (IEDM) > 28.4.1 - 28.4.4
Electronics Letters > 2015 > 51 > 6 > 464 - 465