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Commercial EDA tools are available to verify resistance values of ESD paths. However, since ESD paths relate to whole-chip power/ground (P/G) nets, state-of-the-art commercial resistance extraction tools may result in memory overflow issues when the complexity of P/G nets is too high. The latest 28 nm real products exhibit such issues. This paper presents an efficient flow which solves this issue.
The standard ESD protection schemes are not very reliable for negative charge pump used in Class G Power Amplifiers. This work presents a novel ESD protection scheme using internal charge pump switches as ESD clamps. TLP measurements show that elevated level of ESD protection can be achieved with this scheme.
Functional semiconductor automated handling equipment (AHE) manufactured decades ago with little or inadequate Electrostatic Discharge (ESD) protection consideration, have great potentials for CDM mitigation through retrofit to meet new ESD specifications. Retrofitted AHE hardware component failure is a stochastic process, where the system reliability assessment can be performed using statistical...
We propose a new isolation ring structure for latch-up immunity and power efficiency improvement in smart power IC. The proposed structure improves latch-up rule and power efficiency about 60% and 70% compare to traditional structure. Moreover, it enhances the SOA characteristics and ESD design window as well.
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