Search results for: J. Mitard
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4587 - 4593
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2099 - 2105
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2092 - 2098
2016 IEEE International Electron Devices Meeting (IEDM) > 33.4.1 - 33.4.4
2016 IEEE International Electron Devices Meeting (IEDM) > 25.1.1 - 25.1.4
2016 IEEE International Reliability Physics Symposium (IRPS) > XT-2-1 - XT-2-6
Materials Science in Semiconductor Processing > 2016 > 42 > Part 2 > 255-258