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The quality level of mixed-signal ICs lags behind the below-part-per-million defect test escape rates of digital ICs, as a result of the traditional testing based on performance specifications. Methods increasing the controllability to solve the problem of the low fault coverage of analog and mixed-signal circuits are in practice limited due to the excessive area overhead they require and their impact...
An automatic, defect-oriented method is proposed for activating latent defects in analog and mixed-signal integrated circuits. Based on the topology modification technique, added stress transistors generate voltage stress that activates these latent defects. This contrasts with burn-in testing which uses increased temperatures as a fault activation mechanism. Moreover, this Design-for-Testability...
The quality level of the analog parts in mixed-signal ICs lags behind the below-part-per-million escape rates of the digital core. The reason is that analog blocks in these ICs have high test escape rates as a result of the typical testing based on performance specifications. Test point selection/insertion techniques have been proposed to solve this problem by offering increased observability. However,...
A method is presented to address the automatic generation of test signals for analog and mixed-signal integrated circuits. No restriction on the number of inputs or the nonlin-earity of the circuit are made. The circuit under consideration is first decomposed into a set of sub-circuits, called blocks, in order to break down the complexity of the problem. The effect of a targeted fault is then automatically...
The detection level of defects in today's mixed-signal ICs lags behind the extremely high demand of industries such as automotive. This is mainly because analog blocks in these ICs have high test escape rates as a result of the typical testing based on the performance specifications. Defect-oriented techniques have been proposed to solve the problem of this poor fault coverage for analog circuits...
The growing number of chips in automotive applications has created an increasing urge to avoid electronic failures in the field. Part Average Testing (PAT) is a generally used technique to screen out early-life failures for automotive products. In this paper we demonstrate with industrial data the application of Dynamic Part Average Testing (DPAT) at the final testing stage in order to improve the...
This paper presents a method to address the automatic testing of analog ICs for catastrophic defects. Based on Design-for-Testability building blocks offering extra controllability and extra observability, a test infrastructure is generated for a targeted circuit. The selection of the extra blocks and their insertion into the circuit is done automatically by a workflow based on DC simulations and...
In this paper a method is presented to address the automatic testing of analog ICs. Based on Design-for-Testability building blocks offering extra controllability and extra observability, a test infrastructure is generated for a targeted circuit. The selection of the extra blocks and their insertion into the circuit is done automaticaly by a proposed optimization algorithm. Adopting a defect-oriented...
In this paper a new method is presented to automatically generate a Design-for-Testability infrastructure which increases the observability of defects in integrated circuits. An algorithm is proposed to detect circuit locations to which small detection blocks can be added. Those are coupled to an oscillator and the triggering of this oscillator in case of detected defects leaves traces in the power...
A general method is proposed to automatically generate a DfT solution aiming at the detection of catastrophic faults in analog and mixed-signal integrated circuits. The approach consists in modifying the topology of the circuit by pulling up (down) nodes and then probing differentiating node voltages. The method generates a set of optimal hardware implementations addressing the multi-objective problem...
Electronics are increasingly being embedded in a growing number of applications in our daily life. This demands strong reliability and robustness of those electronic systems. The IC manufacturing process not being perfect, however, inevitably results in some fabricated parts having defects. Test methods must detect such faulty ICs before shipment. While the fault coverage of testing for digital integrated...
A new method is presented to detect catastrophic defects from the signal analysis of dynamic current consumption waveforms of analog circuits. While other techniques use the whole information in a Root-Mean-Square computation or in black-box techniques such as a neural network, the central point of this work resides in the selection of waveform samples to create a signature able to discriminate a...
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