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Thermal characteristic is one of the key specifications in mobile SOC products. Typically, process scaling tends to improve global thermal characteristics by power reduction; however, it also increases local hot-spot issues due to higher power density. Moreover, the finfet device technology introduces a new thermal problem, called “self-heating.” Therefore, Samsung is considering thermal issues comprehensively...
The reliability and availability of today's large-scale systems hinges on the reliability of the often millions of hardware components they comprise. Before deployment, devices undergo rigorous testing as part of the design and manufacturing process to assure they meet reliability expectations. In this talk we will look at the other half of the story: the post-deployment life of devices, once they...
As Si technology advances along with more complex fabrication process, new challenges arise during the advanced technology bring-up stage, especially due to convoluted interaction among process, device and circuit. New test structures and technology bring-up methodologies are necessary to account for process induced variation. Layout and circuit design need to be optimized to mitigate the process...
Adaptive test is a must have to be competitive in the future, and we need better data to support it, and that data has to come from the testers. Now, could someone please tell us how to do it? Because it seems that everyone wants AT, but only a few are willing to pay extra for it.
End to end security is becoming a prerequisite of the Internet of Things. Data must be managed securely at generation, in flight and at rest to avoid critical enterprise or personal data being intercepted. Privacy becomes paramount as our lives and health become increasingly digital, and devices must evolve to deliver security and robustness while pricing continues to be constrained. This talk will...
FPGAs have grown from a simple logic replacement to fully-programmable SoC, with multi-core CPU subsystems, a broad spectrum of peripherals, hundreds of thousands of gates of programmable logic and high-speed multi-gigabit transceivers. As the complexity of the underlying hardware has grown, so has the value of the applications built in them and the data handled by them. Traditional FPGA bitstream...
Although there is a desire to implement Adaptive test, desire may not be enough to overcome the friction of making it happen. Issues with inconsistent data, data formats, data availability, lack of system infrastructure, antiquated methodologies, and the need to rely on outside sources and experts.
Of late, microgrids are getting a lot of attention, not just to support national security at military bases, but also to provide more resilient power supplies at other types of facilities, to allow for increased penetration of renewables, and other reasons. College campuses, military bases, and even corporate campuses are exploring microgrid options. This has spurred creation of new technologies and...
Adaptive test seems a logical solution to address the challenge of increasing IP complexity and shrinking test time budgets. Might slow adoption be a consequence of the Engineering community focus on technical implementation methods, at the expense of addressing the emotional concerns of the Quality and Supply Chain community?
In the past, CMOS feature size scaling has played a big role in overcoming the perceived barriers, routinely enabling cheaper, faster and lower power devices with every new technology node. However, as the benefits of conventional feature size scaling are diminishing, what can we do to meet the needs of next-generation systems? The precise answer to this question is unclear, but most researchers will...
Formal methods are seen as a cheaper and more exhaustive solution to the current expensive testing process used in the aviation industry. However, aviation systems are getting more and more complex. So, formal methods have no hope to address these systems unless some compositional argument is being made. In this talk, I will present the results of the effort led by NASA to demonstrate the use of formal...
As electronic chip designs are predominately System-On-Chip (SoC), hardware emulation has become a crucial tool for pre-silicon hardware and software validation. Pre-silicon emulation models are often available many quarters before tapeout and are used in many areas such as OS boot, software driver development, and system stress and performance testing. Increasingly hardware emulation is used in the...
Circuit techniques for reducing the minimum supply voltage (VMIN) of last-level and intermediate static random-access memory (SRAM) caches enhance processor energy efficiency. For the first time at a 16nm technology node, projections of a high-density 6-transistor SRAM bit cell indicate that the VMIN of a 4Mb or larger cache exceeds the maximum supply voltage (VMAX) for reliability. Thus, circuit...
Big data is now a ubiquitous part of life — both in test and in many other areas. This talk discusses some of the big problems facing us in test and looks at analogous problems outside of the test domain. It aims to both step back and abstract test-specific problems into general problems and point out similarities and contrasts between test and non-test problems. It also highlights interesting aspects...
Due to their spatial structures, FinFETs have several advantages including controlled Fin body thickness, low threshold voltage variation, reduced variability and lower operating voltage. Because of the special structures of FinFET transistors, modern FinFET-based memories can lead to defects that require new test and repair solutions. Usually the existing approaches are not able to provide appropriate...
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