Search results for: Sukeshwar Kannan
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 8 > 1406 - 1419
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2017 > 36 > 5 > 842 - 854
2017 IEEE International Reliability Physics Symposium (IRPS) > 4A-2.1 - 4A-2.7
2015 IEEE International Reliability Physics Symposium > 4C.4.1 - 4C.4.5
Journal of Electronic Testing > 2013 > 29 > 6 > 745-762