Search results for: Akinobu Teramoto
IEEE Electron Device Letters > 2017 > 38 > 9 > 1309 - 1312
2017 IEEE International Reliability Physics Symposium (IRPS) > DG-7.1 - DG-7.5
IEEE Transactions on Electron Devices > 2016 > 63 > 4 > 1795 - 1801
2014 IEEE International Reliability Physics Symposium > 3F.3.1 - 3F.3.4
2014 IEEE International Reliability Physics Symposium > 4A.6.1 - 4A.6.7
physica status solidi c > 10 > 11 > 1557 - 1560
Microelectronic Engineering > 2013 > 109 > Complete > 197-199
Microelectronic Engineering > 2013 > 109 > Complete > 298-301
IEEE Transactions on Electron Devices > 2013 > 60 > 10 > 3555 - 3561
IEEE Transactions on Electron Devices > 2013 > 60 > 6 > 1916 - 1922
IEEE Transactions on Semiconductor Manufacturing > 2013 > 26 > 3 > 288 - 295
IEEE Transactions on Electron Devices > 2012 > 59 > 5 > 1445 - 1453