Search results for: Rihito Kuroda
IEEE Electron Device Letters > 2017 > 38 > 9 > 1309 - 1312
2017 IEEE International Reliability Physics Symposium (IRPS) > DG-7.1 - DG-7.5
2016 IEEE SENSORS > 1 - 3
2016 IEEE SENSORS > 1 - 3
2015 IEEE SENSORS > 1 - 4
IEEE Transactions on Semiconductor Manufacturing > 2015 > 28 > 3 > 289 - 296
IEEE SENSORS 2014 Proceedings > 1664 - 1667
2014 IEEE International Reliability Physics Symposium > 3F.3.1 - 3F.3.4
2014 IEEE International Reliability Physics Symposium > 4A.6.1 - 4A.6.7
Microelectronic Engineering > 2013 > 109 > Complete > 298-301
IEEE Transactions on Electron Devices > 2013 > 60 > 10 > 3555 - 3561
IEEE Transactions on Semiconductor Manufacturing > 2013 > 26 > 3 > 288 - 295
IEEE Journal of Solid-State Circuits > 2013 > 48 > 1 > 329 - 338
IEEE Transactions on Electron Devices > 2012 > 59 > 5 > 1445 - 1453
IEEE Transactions on Semiconductor Manufacturing > 2012 > 25 > 3 > 303 - 309