Search results for: Masumi Saitoh
2017 IEEE International Reliability Physics Symposium (IRPS) > 5C-2.1 - 5C-2.5
Microelectronics Journal > 2016 > 47 > Complete > 1-6
2015 IEEE International Electron Devices Meeting (IEDM) > 6.1.1 - 6.1.4
IEEE Transactions on Electron Devices > 2015 > 62 > 11 > 3799 - 3804
Solid State Electronics > 2015 > 109 > Complete > 58-62
IEEE Electron Device Letters > 2013 > 34 > 2 > 187 - 189
IEEE Transactions on Electron Devices > 2013 > 60 > 4 > 1451 - 1456
2012 IEEE International Reliability Physics Symposium (IRPS) > 6A.3.1 - 6A.3.6
IEEE Electron Device Letters > 2012 > 33 > 1 > 8 - 10
IEEE Transactions on Electron Devices > 2012 > 59 > 12 > 3239 - 3242