Search results for: B. Kaczer
Solid-State Electronics > 2016 > 125 > C > 52-62
Microelectronic Engineering > 2015 > 147 > C > 72-74
Microelectronic Engineering > 2015 > 147 > C > 108-112
Microelectronic Engineering > 2015 > 147 > C > 126-129
Microelectronics Reliability > 2014 > 54 > 11 > 2364-2370
Microelectronics Reliability > 2014 > 54 > 9-10 > 2329-2333
Microelectronic Engineering > 2014 > 114 > Complete > 47-51
Microelectronic Engineering > 2013 > 109 > Complete > 43-45
Microelectronic Engineering > 2013 > 109 > Complete > 314-317
Microelectronic Engineering > 2013 > 109 > Complete > 123-125
Microelectronic Engineering > 2013 > 109 > Complete > 250-256
Microelectronics Reliability > 2012 > 52 > 9-10 > 1883-1890
Microelectronics Reliability > 2012 > 52 > 9-10 > 1932-1935
Microelectronic Engineering > 2011 > 88 > 7 > 1388-1391
Microelectronic Engineering > 2011 > 88 > 7 > 1243-1246
Microelectronics Reliability > 2009 > 49 > 8 > 885-891
Microelectronic Engineering > 2009 > 86 > 7-9 > 1936-1938
Microelectronic Engineering > 2009 > 86 > 7-9 > 1876-1882
Microelectronic Engineering > 2009 > 86 > 7-9 > 1789-1795
Microelectronic Engineering > 2009 > 86 > 7-9 > 1807-1811