Search results for: S. Clima
Microelectronic Engineering > 2017 > 178 > C > 93-97
2016 IEEE International Reliability Physics Symposium (IRPS) > 6C-1-1 - 6C-1-7
2015 IEEE International Electron Devices Meeting (IEDM) > 5.6.1 - 5.6.4
2015 IEEE International Electron Devices Meeting (IEDM) > 10.6.1 - 10.6.4
2015 IEEE International Electron Devices Meeting (IEDM) > 7.5.1 - 7.5.4
Microelectronic Engineering > 2015 > 147 > C > 126-129
Microelectronic Engineering > 2015 > 147 > C > 171-175
2014 IEEE International Electron Devices Meeting > 14.2.1 - 14.2.4
2013 IEEE International Electron Devices Meeting > 10.2.1 - 10.2.4