Search results for: T. Grasser
Semiconductors > 2018 > 52 > 13 > 1738-1742
Semiconductors > 2018 > 52 > 10 > 1298-1302
Microelectronics Reliability > 2018 > 87 > C > 286-320
Semiconductors > 2018 > 52 > 2 > 242-247
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2099 - 2105
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2092 - 2098
2017 IEEE International Reliability Physics Symposium (IRPS) > 2D-6.1 - 2D-6.7
2017 IEEE International Reliability Physics Symposium (IRPS) > XT-10.1 - XT-10.6
2017 IEEE International Reliability Physics Symposium (IRPS) > XT-11.1 - XT-11.6
2017 IEEE International Reliability Physics Symposium (IRPS) > 3B-5.1 - 3B-5.5
2017 IEEE International Reliability Physics Symposium (IRPS) > 6A-6.1 - 6A-6.6
2017 IEEE International Reliability Physics Symposium (IRPS) > 6A-2.1 - 6A-2.6
Solid-State Electronics > 2016 > 125 > C > 52-62
Lecture Notes in Computer Science > Large-Scale Scientific Computing > Monte Carlo: Methods, Applications, Distributed Computing > 443-450
2016 IEEE International Reliability Physics Symposium (IRPS) > 5A-2-1 - 5A-2-8
2016 IEEE International Reliability Physics Symposium (IRPS) > 5A-1-1 - 5A-1-6