Search results for: Guogong Wang
Microelectronics Reliability > 2013 > 53 > 3 > 409-413
2010 IEEE MTT-S International Microwave Symposium > 1512 - 1515
IEEE Transactions on Circuits and Systems I: Regular Papers > 2009 > 56 > 7 > 1455 - 1466
Materials Science in Semiconductor Processing > 2005 > 8 > 1-3 > 323-326