Search results for: Pingxi Ma
Microelectronics Reliability > 2012 > 52 > 11 > 2568-2571
IEEE Transactions on Nuclear Science > 2006 > 53 > 4-2 > 2361 - 2366
Materials Science in Semiconductor Processing > 2005 > 8 > 1-3 > 323-326
Solid State Electronics > 2001 > 45 > 1 > 159-167
Chinese Science Abstracts Series A > 1995 > 14 > 6 > 33